AI (Artificial Intelligence) PhD student wins best poster presentation at Dimensional X-Ray Computed Tomography Conference

The annual (dXCT) conference took place between 13-16 June 2022. Researchers from the School of Computer Science and Electronic Engineering presented their results and was awarded the prize for the “best poster” presentation.

The dXCT conference is coordinated by the UK’s (NPL) and brings together researchers to discuss the latest developments in X-ray computed tomography (XCT) dimensional measurement and its industrial applications.

Mr Iwan T. Mitchell (PhD student) and his supervisor, Dr Franck P. Vidal (Senior Lecturer in computer science) gave two presentations. First, an oral presentation on experimental microtomography (microCT) and high-fidelity simulations, titled “”, which is a collaboration between �鶹�� and INSA-Lyon (France).

The poster presentation of Iwan and Franck - x-ray simulations for scan planning and training

Second, they delivered a research paper titled “”, which was given as a poster presentation, and was awarded the “Best Poster Presentation” Prize. The prize was sponsored by Waygate Technologies. This work is a collaboration between �鶹�� and Swansea Universities. The printed poster included a QR-code that enabled an Augmented Reality (AR) demonstration of his XCT simulation software.

Iwan Mitchell giving his presentation to one person in a room will wall boards full of information

Iwan (who is supported by the Artificial Intelligence, Machine Learning and Advanced Computing ( doctoral training centre) said, “It was exciting to be at the Dimensional XCT this year! Seeing how XCT can be applied in a metrology standpoint, and how every stage of the process can be calibrated for accurate results. Over the four days I have had inspiring discussions, alongside intriguing talks on how important quality XCT can be applied to many fields. I was a bit shocked at being nominated the best poster, because I had so much fun talking to like-minded people about my research!"

lecture given by Iwan and Franck in a lecture room with information being presented on the board

Dr Vidal said “Missed the conference? You can scan the QR (Quick Response) code below at home with your Smartphone to experience the demo!”

He continued by adding “It is always a delight to attend Computed Tomography conferences and see how X-ray imaging is used in metrology (the science of measurements). The scientific talks were extremely interesting. I like seeing this increase in the use of computational simulations, something I am particularly interested in. What made the conference stand out is the relevance of the 2-day training, and the exhibition hall populated with all the major XCT manufacturers or distributors. No need to say I was an incredibly happy supervisor when Iwan was given an award for his research contribution. Well done, Iwan.”